* '''Nano Letters 7 (2007), 2596-2601''': Eymery J, Rieutord F, Favre-Nicolin V, Robach O, Niquet YM, Froberg L, Martensson T, Samuelson L Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques * '''J. Appl. Phys. 102 (2007), 24101''': Merckling C, El-Kazzi M, Saint-Girons G, Hollinger G, Largeau L, Patriarche G, Favre-Nicolin V , Marty O Growth of crystalline gamma-Al₂O₃ on Si by molecular beam epitaxy: Influence of the substrate orientation * '''J. Cryst. Growth 306 (2007), 47-51''': Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G , Hollinger G Strain relaxation and critical thickness for epitaxial LaAlO3 thin films grown on SrTiO3(001) substrates by molecular beam epitaxy * '''Phys. Rev. B 75 (2007),235312''': Coraux J, Favre-Nicolin V, Proietti MG, Daudin B, Renevier H Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots * '''Thin Sol. Films 515 (2007), 6479-6483''': Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G Epitaxial growth and relaxation of gamma-Al2O3 on silicon * '''Z. Krist. 222 (2007), 105-113''': Cerny R, Favre-Nicolin V Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives * http://dx.doi.org/10.1063/1.2422902 '''J. Appl. Phys. 101 (2007), 56106''': Coraux J, Favre-Nicolin V, Renevier H, Proietti MG, Amstatt B, Bellet-Amalric E, Daudin B Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction * '''Phys. Rev. B74 (2006),195302''': Coraux J, Amstatt B, Budagoski JA, Bellet-Amalric E, Rouviere JL, Favre-Nicolin V, Proietti MG, Renevier H , Daudin B Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study * '''Appl. Phys. Lett. 89 (2006), 153129''': Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A Growth mechanism of Si nanowhiskers and SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations * '''Appl. Phys. Lett. 89 (2006), 143114''': Schulli TU, Richard MI, Renaud G, Favre-Nicolin V, Wintersberger E, Bauer G In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods * '''Phys. Stat. Sol. B243 (2006), 1519-1523''': Coraux J, Renevier H, Proietti MG, Favre-Nicolin V, Daudin B, Renaud G In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots * '''Z Krist. (2006 suppl 23), 411-416''': Cerny R, Renaudin G, Tokaychuk Y, Favre-Nicolin V Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction http://dx.doi.org/10.1524/zksu.2006.suppl_23.411 * '''Phys Rev B73 (20006), 205343''': Coraux J, Proietti MG, Favre-Nicolin V, Renevier H, Daudin B Step-by-step capping and strain state of GaN/AlN quantum dots studied by grazing-incidence diffraction anomalous fine structure * '''Nucl Inst. & Meth. Phys. B246 (2006), 58-63''': Coraux J, Favre-Nicolin V, Proletti MG, Renevier H, Daudin B Grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots * '''Appl. Phys. Lett. 88 (2006), 153125''': Coraux J, Renevier H, Favre-Nicolin V, Renaud G, Daudin B In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth * '''Powder Diffr. 20 (2005), 359-365''': Cerny R, Favre-Nicolin V FOX: A friendly tool to solve nonmolecular structures from powder diffraction * '''Phys. B: Cond. Matt 357 (2005), 11-15''': Letoublon A, Favre-Nicolin V, Renevier H, Proletti MG, Monat C, Gendry M, Marty O, Priester C Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence * '''Z. Krist. 219 (2004), 847-856''': Favre-Nicolin- V, Cerny R A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction * '''Acta Cryst B60 (2004), 272-281''': Cerny R, Renaudin G, Favre-Nicolin V, Hlukhyy V, Pottgen R Mg_1+xIr_1-x (x=0, 0.037 and 0.054), a binary intermetallic compound with a new orthorhombic structure type determined from powder and single-crystal X-ray diffraction * '''Phys Rev Lett. 92 (2004), 186101''': Letoublon A, Favre-Nicolin V, Renevier H, Proietti MG, Monat C, Gendry M, Marty O, Priester C Strain, size, and composition of InAs quantum sticks embedded in InP determined via grazing incidence x-ray anomalous diffraction * Mat. Sci For. 443-4 (2004), 35-38: Favre-Nicolin V, Cerny R FOX: Modular approach to crystal structure determination from powder diffraction * '''J. Alloys & Comp. 348 (2003), 129-137''': Guenee L, Favre-Nicolin V, Yvon K Synthesis, crystal structure and hydrogenation properties of the ternary compounds LaNi4Mg and NdNi4Mg * '''J. Appl. Cryst. 35(2002), 734-743''': Favre-Nicolin V, Cerny R FOX, 'free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction * '''Chem. Comm. 8(2002), 808-809''': Edgar M, Carter VJ, Tunstall DP, Grewal P, Favre-Nicolin V, Cox PA, Lightfoot P, Wright PA Structure solution of a novel aluminium methylphosphonate using a new simulated annealing program and powder X-ray diffraction data * '''Acta Cryst. C58(2002), i31-i32''': Cerny R, Favre-Nicolin V, Bertheville B A tetragonal polymorph of caesium hydroxide monohydrate, CsOH center dot H2O, from X-ray powder data * '''Phys. Rev. Lett. 87 (2001), 015502''': Favre-Nicolin V, Bos S, Lorenzo JE, Hodeau JL, Berar JF, Monceau P, Currat R, Levy F, Berger H Structural evidence for Ta-tetramerization displacements in the charge-density-wave compound (TaSe4)(2)I from x-ray anomalous diffraction * '''Chem. Rev. 101 (2001), 1843-1867''': Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF Resonant diffraction * '''J. Appl. Cryst 33(2000), 52-63''': Favre-Nicolin V, Bos S, Lorenzo JE, Bordet P, Shepard W, Hodeau JL Integration procedure for the quantitative analysis of dispersive anomalous diffraction