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* [[http://dx.doi.org/10.1021/nl070888q|'''Nano Letters 7 (2007), 2596-2601''']]: Eymery J, Rieutord F, Favre-Nicolin V, Robach O, Niquet YM, Froberg L, Martensson T, Samuelson L ''Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques''
* [[http://dx.doi.org/10.1063/1.2753684|'''J. Appl. Phys. 102 (2007), 24101''']]: Merckling C, El-Kazzi M, Saint-Girons G, Hollinger G, Largeau L, Patriarche G, Favre-Nicolin V , Marty O ''Growth of crystalline gamma-Al<sub>2</sub>O<sub>3</sub> on Si by molecular beam epitaxy: Influence of the substrate orientation''
* [[http://dx.doi.org/10.1016/j.jcrysgro.2007.04.048|'''J. Cryst. Growth 306 (2007), 47-51''']]: Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G , Hollinger G ''Strain relaxation and critical thickness for epitaxial LaAlO3 thin films grown on SrTiO3(001) substrates by molecular beam epitaxy''
* [[http://dx.doi.org/10.1103/PhysRevB.75.235312|'''Phys. Rev. B 75 (2007),235312''']]: Coraux J, Favre-Nicolin V, Proietti MG, Daudin B, Renevier H ''Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots''
* [[http://dx.doi.org/10.1016/j.tsf.2006.11.157|'''Thin Sol. Films 515 (2007), 6479-6483''']]: Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G ''Epitaxial growth and relaxation of gamma-Al2O3 on silicon''
* [[http://dx.doi.org/10.1524/zkri.2007.222.3-4.105|'''Z. Krist. 222 (2007), 105-113''']]: Cerny R, Favre-Nicolin V ''Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives'' * [[http://dx.doi.org/10.1063/1.2422902 '''J. Appl. Phys. 101 (2007), 56106''']]: Coraux J, Favre-Nicolin V, Renevier H, Proietti MG, Amstatt B, Bellet-Amalric E, Daudin B ''Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction''
* [[http://dx.doi.org/10.1103/PhysRevB.74.195302|'''Phys. Rev. B74 (2006),195302''']]: Coraux J, Amstatt B, Budagoski JA, Bellet-Amalric E, Rouviere JL, Favre-Nicolin V, Proietti MG, Renevier H , Daudin B ''Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study''
* [[http://dx.doi.org/10.1063/1.2360225|'''Appl. Phys. Lett. 89 (2006), 153129''']]: Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A ''Growth mechanism of Si nanowhiskers and SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations''
* [[http://dx.doi.org/10.1063/1.2358300|'''Appl. Phys. Lett. 89 (2006), 143114''']]: Schulli TU, Richard MI, Renaud G, Favre-Nicolin V, Wintersberger E, Bauer G ''In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods''
* [[http://dx.doi.org/10.1002/pssb.200565247|'''Phys. Stat. Sol. B243 (2006), 1519-1523''']]: Coraux J, Renevier H, Proietti MG, Favre-Nicolin V, Daudin B, Renaud G ''In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots''
* [[http://dx.doi.org/10.1524/zksu.2006.suppl_23.411|'''Z Krist. (2006 suppl 23), 411-416''']]: Cerny R, Renaudin G, Tokaychuk Y, Favre-Nicolin V ''Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction'' http://dx.doi.org/10.1524/zksu.2006.suppl_23.411
* [[http://dx.doi.org/10.1103/PhysRevB.73.205343|'''Phys Rev B73 (20006), 205343''']]: Coraux J, Proietti MG, Favre-Nicolin V, Renevier H, Daudin B ''Step-by-step capping and strain state of GaN/AlN quantum dots studied by grazing-incidence diffraction anomalous fine structure''
* [[http://dx.doi.org/10.1016/j.nimb.2005.12.045|'''Nucl Inst. & Meth. Phys. B246 (2006), 58-63''']]: Coraux J, Favre-Nicolin V, Proletti MG, Renevier H, Daudin B ''Grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots''
* [[http://dx.doi.org/10.1063/1.2192572|'''Appl. Phys. Lett. 88 (2006), 153125''']]: Coraux J, Renevier H, Favre-Nicolin V, Renaud G, Daudin B ''In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth''
* [[http://dx.doi.org/10.1154/1.2135314|'''Powder Diffr. 20 (2005), 359-365''']]: Cerny R, Favre-Nicolin V ''FOX: A friendly tool to solve nonmolecular structures from powder diffraction''
* [[http://dx.doi.org/10.1016/j.physb.2004.11.009|'''Phys. B: Cond. Matt 357 (2005), 11-15''']]: Letoublon A, Favre-Nicolin V, Renevier H, Proletti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence'' * [[http://dx.doi.org/10.1524/zkri.219.12.847.55869|'''Z. Krist. 219 (2004), 847-856''']]: Favre-Nicolin- V, Cerny R ''A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction''
* [[http://scripts.iucr.org/cgi-bin/paper?av5006|'''Acta Cryst B60 (2004), 272-281''']]: Cerny R, Renaudin G, Favre-Nicolin V, Hlukhyy V, Pottgen R ''Mg<sub>1+x</sub>Ir<sub>1-x</sub> (x=0, 0.037 and 0.054), a binary intermetallic compound with a new orthorhombic structure type determined from powder and single-crystal X-ray diffraction''
* [[http://dx.doi.org/10.1103/PhysRevLett.92.186101|'''Phys Rev Lett. 92 (2004), 186101''']]: Letoublon A, Favre-Nicolin V, Renevier H, Proietti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size, and composition of InAs quantum sticks embedded in InP determined via grazing incidence x-ray anomalous diffraction''
* '''Mat. Sci For. 443-4 (2004), 35-38''': Favre-Nicolin V, Cerny R ''FOX: Modular approach to crystal structure determination from powder diffraction''
* [[http://dx.doi.org/10.1016/S0925-8388(02)00797-1|'''J. Alloys & Comp. 348 (2003), 129-137''']]: Guenee L, Favre-Nicolin V, Yvon K ''Synthesis, crystal structure and hydrogenation properties of the ternary compounds LaNi4Mg and NdNi4Mg''
* [[http://scripts.iucr.org/cgi-bin/paper?vi0168|'''J. Appl. Cryst. 35(2002), 734-743''']]: Favre-Nicolin V, Cerny R ''FOX, 'free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction''
* [[http://www.rsc.org/publishing/journals/CC/article.asp?doi=b200318j|'''Chem. Comm. 8(2002), 808-809''']]: Edgar M, Carter VJ, Tunstall DP, Grewal P, Favre-Nicolin V, Cox PA, Lightfoot P, Wright PA ''Structure solution of a novel aluminium methylphosphonate using a new simulated annealing program and powder X-ray diffraction data''
* [[http://scripts.iucr.org/cgi-bin/paper?S0108270101021928|'''Acta Cryst. C58(2002), i31-i32''']]: Cerny R, Favre-Nicolin V, Bertheville B ''A tetragonal polymorph of caesium hydroxide monohydrate, CsOH center dot H2O, from X-ray powder data''
* [[http://dx.doi.org/10.1103/PhysRevLett.87.015502|'''Phys. Rev. Lett. 87 (2001), 015502''']]: Favre-Nicolin V, Bos S, Lorenzo JE, Hodeau JL, Berar JF, Monceau P, Currat R, Levy F, Berger H ''Structural evidence for Ta-tetramerization displacements in the charge-density-wave compound (TaSe4)(2)I from x-ray anomalous diffraction''
* [[http://dx.doi.org/10.1021/cr0000269|'''Chem. Rev. 101 (2001), 1843-1867''']]: Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF ''Resonant diffraction''
* [[http://dx.doi.org/10.1107/S0021889899012364|'''J. Appl. Cryst 33(2000), 52-63''']]: Favre-Nicolin V, Bos S, Lorenzo JE, Bordet P, Shepard W, Hodeau JL ''Integration procedure for the quantitative analysis of dispersive anomalous diffraction''		  * [[http://prb.aps.org/abstract/PRB/v85/i11/e115204|Phys. Rev. B85 (2012), 115204]]: E. Arras, F. Lançon, I. Slipukhina, É. Prestat, M. Rovezzi, S. Tardif, A. Titov, P. Bayle-Guillemaud, F. d’Acapito, A. Barski, V. Favre-Nicolin, M. Jamet, J. Cibert, and P. Pochet ''Interface-driven phase separation in multifunctional materials: The case of the ferromagnetic semiconductor !GeMn''
 * [[http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-20-19223|Opt. Express 19 (2011), 19223-19232]]: F. Mastropietro, D. Carbone, A. Diaz, J. Eymery, A. Sentenac, T.H. Metzger, V. Chamard, and V. Favre-Nicolin ''Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate''
 * [[http://link.aps.org/doi/10.1103/PhysRevB.84.075314|Phys. Rev. B 84 (2011), 075314]]: M.-I. Richard, A. Malachias, J.-L. Rouvière, T.-S. Yoon, E. Holmström, Y.-H. Xie, V. Favre-Nicolin, V. Holý, K. Nordlund, G. Renaud, and T.-H. Metzger, ''Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis''
 * [[http://dx.doi.org/10.1107/S0021889811009009|J. Appl. Cryst. 44 (2011), 635-640]] V. Favre-Nicolin, J. Coraux, M.-I. Richard, and H. Renevier, ''Fast computation of scattering maps of nanostructures using graphical processing units'' [[http://arxiv.org/abs/1010.2641|arXiv]]
 * [[http://dx.doi.org/10.1209/0295-5075/93/66004|EPL 93 (2011) 66004]]: N. A. Katcho, M.-I. Richard, M. G. Proietti, H. Renevier, C. Leclere, V. Favre-Nicolin, J. J. Zhang and G. Bauer ''Composition and strain of Ge domes on Si(001) close to the dome/susbtrate interface''
 * [[http://dx.doi.org/10.1063/1.3531222|J. Appl. Phys. 109, 013911 (2011)]]: A. Jain, M. Jamet, A. Barski, T. Devillers, I.-S. Yu, C. Porret, P. Bayle-Guillemaud, V. Favre-Nicolin, S. Gambarelli, V. Maurel, G. Desfonds, J. F. Jacquot, and S. Tardif ''Structure and magnetism of Ge,,3,,Mn,,5,, clusters''
 * [[http://link.aps.org/doi/10.1103/PhysRevB.82.104101|Phys. Rev. B82 (2010), 104101]]: S. Tardif, V. Favre-Nicolin, F. Lançon, E. Arras, M. Jamet, A. Barski, C. Porret, P. Bayle-Guillemaud, P. Pochet, T. Devillers, and M. Rovezzi ''Strain and correlation of self-organized Ge1−xMnx nanocolumns embedded in Ge (001)'' [[http://arxiv.org/abs/1006.5439|arXiv:1006.5439]]
 * [[http://www.uninsubria.it/pls/uninsubria/consultazione.mostra_pagina?id_pagina=11545|Diffraction at the Nanoscale - Nanocrystals, Defective & Amorphous Materials]] (2010) ed. by Antonietta Guagliardi and Norberto Masciocchi, (ISBN 978-88-95362-35-9), Insubria Univ. Press
 * [[http://dx.doi.org/10.1088/1367-2630/12/3/035013|New J. Phys. 12 (2010), 035013]]: V Favre-Nicolin, F Mastropietro, J Eymery, D Camacho, Y M Niquet, B M Borg, M E Messing, L-E Wernersson, R E Algra, E P A M Bakkers, T H Metzger, R Harder and I K Robinson ''Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging''
 * [[http://dx.doi.org/10.1103/PhysRevB.81.153306|Phys. Rev. B81 (2010), 153306]]: O. Landré, D. Camacho, C. Bougerol, Y. M. Niquet, V. Favre-Nicolin, G. Renaud, H. Renevier, B. Daudin ''Elastic strain relaxation in GaN/AlN nanowire superlattice''
 * [[http://www.inderscience.com/www/news/ijnt2010v7n4-8_toc.pdf|Int. J. Nanotechnol., Vol. 7 (2010), 575]]: M. Jamet, T. Devillers, I-S. Yu, A. Barski, P. Bayle-Guillemaud, J. Rothman, V. Favre-Nicolin, S. Tardif, S. Cherifi, J. Cibert, L. Grenet, P. Noé and V. Calvo ''(Ge,Mn): A ferromagnetic semiconductor for spin injection in silicon''
 * [[http://iopscience.iop.org/1742-6596/190/1/012129/|J. Phys.: Conf. Ser. 190 (2010), 012129]]: N A Katcho, M I Richard, O Landré, G Tourbot, M G Proietti, H Renevier, V Favre-Nicolin, B Daudin, G Chen, J J Zhang and G Bauer ''Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction''
 * [[http://dx.doi.org/10.1103/PhysRevB.79.195401| Phys. Rev. B79 (2009), 195401]] V. Favre-Nicolin, J. Eymery, R.K. Koster, P. Gentile ''Coherent Diffraction Imaging of Single 95nm Nanowires''
 * [[http://www.eyrolles.com/Sciences/Livre/rayons-x-et-matiere-9782746220980| Rayons X & Matière 2007]] édité par Philippe Goudeau, René Guinebretière (Eyrolles) - chapitre 4 "Étude de nanostructures de semi-conducteurs par rayonnement synchrotron"
 * [[http://dx.doi.org/10.1088/1742-6596/190/1/012129|J. Phys.: Conf. Ser. 190 (2009) 012129]] N A Katcho,M I Richard, O Landré, G Tourbot, M G Proietti, H Renevier, V Favre-Nicolin, B Daudin, G Chen,J J Zhang, G Bauer ''Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction''
 * [[http://dx.doi.org/10.1063/1.3114369|Appl. Phys. Lett. 94 (2009),131911]]: J. Eymery, V. Favre-Nicolin, L. Fröberg, and L. Samuelson ''X-ray measurements of the strain and shape of dielectric/metallic wrap-gated !InAs nanowires''
 * [[http://dx.doi.org/10.1140/epjst/e2009-00929-4|Eur. Phys. J. 167 (2009),3-10]]: Richard MI, Katcho NA, Proietti MG, Renevier H, Favre-Nicolin V, Zhong Z, Chen G, Stoffel M, Schmidt O , Renaud G, Schulli TU, Bauer G ''Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction''
 * [[http://dx.doi.org/10.1063/1.3064157|Appl. Phys. Lett. 94 (2009), 13112]]: Richard MI, Favre-Nicolin V, Renaud G, Schulli TU, Priester C, Zhong Z, Metzger TH ''Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays''
 *[[http://dx.doi.org/10.1007/s11224-008-9312-0|Structural Chemistry 19 (2008), 517-525]]:Husak M, Jegorov A, Brus J, van Beek W, Pattison P, Christensen M, Favre-Nicolin V, Maixner J ''Metergoline II: structure solution from powder diffraction data with preferred orientation and from microcrystal''
 * [[http://dx.doi.org/10.1016/j.tsf.2008.08.165|Thin Solid Films 517 (2008) 197–200]]: C. Merckling, G. Saint-Girons, G. Delhaye, G. Patriarche, L. Largeau, V. Favre-Nicollin, M. El-Kazzi, P. Regreny, B. Vilquin, O. Marty, C. Botella, M. Gendry, G. Grenet, Y. Robach, G. Hollinger ''Epitaxial growth of high-k oxides on silicon''
 * [[http://link.aip.org/link/?JAPIAU/104/063521/1| J. Appl. Phys. 104, 063521 (2008)]]:B. Amstatt, O. Landré, V. Favre Nicolin, M. G. Proietti, E. Bellet-Amalric, C. Bougerol, H. Renevier, and B. Daudin ''Anisotropic strain state of the [1-100] GaN quantum dots and quantum wires''
 * [[http://www.elsevierdirect.com/product.jsp?isbn=9780444530998|Characterization of Semiconductor Heterostructures and Nanostructures, Ed. by C Lamberti]]: T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Sch&uuml;lli ''Chapter 10: Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering''
 * [[http://dx.doi.org/10.1063/1.2944140| Appl. Phys. Lett. 92 (2008), 241907]]: G. Saint-Girons, C. Priester, P. Regreny, G. Patriarche, L. Largeau, V. Favre-Nicolin, G. Xu, Y. Robach, M. Gendry, and Guy Hollinger ''Spontaneous compliance of the InP/SrTiO3 heterointerface''
 * [[http://dx.doi.org/10.1021/nl070888q|Nano Letters 7 (2007), 2596-2601]]: Eymery J, Rieutord F, Favre-Nicolin V, Robach O, Niquet YM, Froberg L, Martensson T, Samuelson L ''Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques''
 * [[http://dx.doi.org/10.1063/1.2753684|J. Appl. Phys. 102 (2007), 24101]]: Merckling C, El-Kazzi M, Saint-Girons G, Hollinger G, Largeau L, Patriarche G, Favre-Nicolin V , Marty O ''Growth of crystalline gamma-Al<sub>2</sub>O<sub>3</sub> on Si by molecular beam epitaxy: Influence of the substrate orientation''
 * [[http://dx.doi.org/10.1016/j.jcrysgro.2007.04.048|J. Cryst. Growth 306 (2007), 47-51]]: Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G , Hollinger G ''Strain relaxation and critical thickness for epitaxial !LaAlO3 thin films grown on !SrTiO3(001) substrates by molecular beam epitaxy''
 * [[http://dx.doi.org/10.1103/PhysRevB.75.235312|Phys. Rev. B 75 (2007),235312]]: Coraux J, Favre-Nicolin V, Proietti MG, Daudin B, Renevier H ''Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots''
 * [[http://dx.doi.org/10.1016/j.tsf.2006.11.157|Thin Sol. Films 515 (2007), 6479-6483]]: Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G ''Epitaxial growth and relaxation of gamma-!Al2O3 on silicon''
 * [[http://dx.doi.org/10.1524/zkri.2007.222.3-4.105|Z. Krist. 222 (2007), 105-113]]: Cerny R, Favre-Nicolin V ''Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives''
 * [[http://dx.doi.org/10.1063/1.2422902|J. Appl. Phys. 101 (2007), 56106]]: Coraux J, Favre-Nicolin V, Renevier H, Proietti MG, Amstatt B, Bellet-Amalric E, Daudin B ''Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction''
 * [[http://dx.doi.org/10.1103/PhysRevB.74.195302|Phys. Rev. B74 (2006),195302]]: Coraux J, Amstatt B, Budagoski JA, Bellet-Amalric E, Rouviere JL, Favre-Nicolin V, Proietti MG, Renevier H , Daudin B ''Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study''
 * [[http://dx.doi.org/10.1063/1.2360225|Appl. Phys. Lett. 89 (2006), 153129]]: Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A ''Growth mechanism of Si nanowhiskers and !SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations''
 * [[http://dx.doi.org/10.1063/1.2358300|Appl. Phys. Lett. 89 (2006), 143114]]: Schulli TU, Richard MI, Renaud G, Favre-Nicolin V, Wintersberger E, Bauer G ''In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods''
 * [[http://dx.doi.org/10.1002/pssb.200565247|Phys. Stat. Sol. B243 (2006), 1519-1523]]: Coraux J, Renevier H, Proietti MG, Favre-Nicolin V, Daudin B, Renaud G ''In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots''
 * [[http://dx.doi.org/10.1524/zksu.2006.suppl_23.411|Z Krist. (2006 suppl 23), 411-416]]: Cerny R, Renaudin G, Tokaychuk Y, Favre-Nicolin V ''Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction''
 * [[http://dx.doi.org/10.1103/PhysRevB.73.205343|Phys Rev B73 (20006), 205343]]: Coraux J, Proietti MG, Favre-Nicolin V, Renevier H, Daudin B ''Step-by-step capping and strain state of GaN/AlN quantum dots studied by grazing-incidence diffraction anomalous fine structure''
 * [[http://dx.doi.org/10.1016/j.nimb.2005.12.045|Nucl Inst. & Meth. Phys. B246 (2006), 58-63]]: Coraux J, Favre-Nicolin V, Proletti MG, Renevier H, Daudin B ''Grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots''
 * [[http://dx.doi.org/10.1063/1.2192572|Appl. Phys. Lett. 88 (2006), 153125]]: Coraux J, Renevier H, Favre-Nicolin V, Renaud G, Daudin B ''In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth''
 * [[http://dx.doi.org/10.1154/1.2135314|Powder Diffr. 20 (2005), 359-365]]: Cerny R, Favre-Nicolin V ''FOX: A friendly tool to solve nonmolecular structures from powder diffraction''
 * [[http://dx.doi.org/10.1016/j.physb.2004.11.009|Phys. B: Cond. Matt 357 (2005), 11-15]]: Letoublon A, Favre-Nicolin V, Renevier H, Proletti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size and composition of !InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence''   * [[http://dx.doi.org/10.1524/zkri.219.12.847.55869|Z. Krist. 219 (2004), 847-856]]: Favre-Nicolin- V, Cerny R ''A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction''
 * [[http://scripts.iucr.org/cgi-bin/paper?av5006|Acta Cryst B60 (2004), 272-281]]: Cerny R, Renaudin G, Favre-Nicolin V, Hlukhyy V, Pottgen R ''Mg<sub>1+x</sub>Ir<sub>1-x</sub> (x=0, 0.037 and 0.054), a binary intermetallic compound with a new orthorhombic structure type determined from powder and single-crystal X-ray diffraction''
 * [[http://dx.doi.org/10.1103/PhysRevLett.92.186101|Phys Rev Lett. 92 (2004), 186101]]: Letoublon A, Favre-Nicolin V, Renevier H, Proietti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size, and composition of !InAs quantum sticks embedded in InP determined via grazing incidence x-ray anomalous diffraction''
 * '''Mat. Sci For. 443-4 (2004), 35-38''': Favre-Nicolin V, Cerny R ''FOX: Modular approach to crystal structure determination from powder diffraction''
 * [[http://dx.doi.org/10.1016/S0925-8388(02)00797-1|J. Alloys & Comp. 348 (2003), 129-137]]: Guenee L, Favre-Nicolin V, Yvon K ''Synthesis, crystal structure and hydrogenation properties of the ternary compounds !LaNi4Mg and !NdNi4Mg''
 * [[http://scripts.iucr.org/cgi-bin/paper?vi0168|J. Appl. Cryst. 35(2002), 734-743]]: Favre-Nicolin V, Cerny R ''FOX, 'free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction''
 * [[http://www.rsc.org/publishing/journals/CC/article.asp?doi=b200318j|Chem. Comm. 8(2002), 808-809]]: Edgar M, Carter VJ, Tunstall DP, Grewal P, Favre-Nicolin V, Cox PA, Lightfoot P, Wright PA ''Structure solution of a novel aluminium methylphosphonate using a new simulated annealing program and powder X-ray diffraction data''
 * [[http://scripts.iucr.org/cgi-bin/paper?S0108270101021928|Acta Cryst. C58(2002), i31-i32]]: Cerny R, Favre-Nicolin V, Bertheville B ''A tetragonal polymorph of caesium hydroxide monohydrate, CsOH center dot H2O, from X-ray powder data''
 * [[http://dx.doi.org/10.1103/PhysRevLett.87.015502|Phys. Rev. Lett. 87 (2001), 015502]]: Favre-Nicolin V, Bos S, Lorenzo JE, Hodeau JL, Berar JF, Monceau P, Currat R, Levy F, Berger H ''Structural evidence for Ta-tetramerization displacements in the charge-density-wave compound (!TaSe4)(2)I from x-ray anomalous diffraction''
 * [[http://dx.doi.org/10.1021/cr0000269|Chem. Rev. 101 (2001), 1843-1867]]: Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF ''Resonant diffraction''
 * [[http://dx.doi.org/10.1107/S0021889899012364|J. Appl. Cryst 33(2000), 52-63]]: Favre-Nicolin V, Bos S, Lorenzo JE, Bordet P, Shepard W, Hodeau JL ''Integration procedure for the quantitative analysis of dispersive anomalous diffraction''

  • Phys. Rev. B85 (2012), 115204: E. Arras, F. Lançon, I. Slipukhina, É. Prestat, M. Rovezzi, S. Tardif, A. Titov, P. Bayle-Guillemaud, F. d’Acapito, A. Barski, V. Favre-Nicolin, M. Jamet, J. Cibert, and P. Pochet Interface-driven phase separation in multifunctional materials: The case of the ferromagnetic semiconductor GeMn

  • Opt. Express 19 (2011), 19223-19232: F. Mastropietro, D. Carbone, A. Diaz, J. Eymery, A. Sentenac, T.H. Metzger, V. Chamard, and V. Favre-Nicolin Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate

  • Phys. Rev. B 84 (2011), 075314: M.-I. Richard, A. Malachias, J.-L. Rouvière, T.-S. Yoon, E. Holmström, Y.-H. Xie, V. Favre-Nicolin, V. Holý, K. Nordlund, G. Renaud, and T.-H. Metzger, Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis

  • J. Appl. Cryst. 44 (2011), 635-640 V. Favre-Nicolin, J. Coraux, M.-I. Richard, and H. Renevier, Fast computation of scattering maps of nanostructures using graphical processing units arXiv

  • EPL 93 (2011) 66004: N. A. Katcho, M.-I. Richard, M. G. Proietti, H. Renevier, C. Leclere, V. Favre-Nicolin, J. J. Zhang and G. Bauer Composition and strain of Ge domes on Si(001) close to the dome/susbtrate interface

  • J. Appl. Phys. 109, 013911 (2011): A. Jain, M. Jamet, A. Barski, T. Devillers, I.-S. Yu, C. Porret, P. Bayle-Guillemaud, V. Favre-Nicolin, S. Gambarelli, V. Maurel, G. Desfonds, J. F. Jacquot, and S. Tardif Structure and magnetism of Ge3Mn5 clusters

  • Phys. Rev. B82 (2010), 104101: S. Tardif, V. Favre-Nicolin, F. Lançon, E. Arras, M. Jamet, A. Barski, C. Porret, P. Bayle-Guillemaud, P. Pochet, T. Devillers, and M. Rovezzi Strain and correlation of self-organized Ge1−xMnx nanocolumns embedded in Ge (001) arXiv:1006.5439

  • Diffraction at the Nanoscale - Nanocrystals, Defective & Amorphous Materials (2010) ed. by Antonietta Guagliardi and Norberto Masciocchi, (ISBN 978-88-95362-35-9), Insubria Univ. Press

  • New J. Phys. 12 (2010), 035013: V Favre-Nicolin, F Mastropietro, J Eymery, D Camacho, Y M Niquet, B M Borg, M E Messing, L-E Wernersson, R E Algra, E P A M Bakkers, T H Metzger, R Harder and I K Robinson Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

  • Phys. Rev. B81 (2010), 153306: O. Landré, D. Camacho, C. Bougerol, Y. M. Niquet, V. Favre-Nicolin, G. Renaud, H. Renevier, B. Daudin Elastic strain relaxation in GaN/AlN nanowire superlattice

  • Int. J. Nanotechnol., Vol. 7 (2010), 575: M. Jamet, T. Devillers, I-S. Yu, A. Barski, P. Bayle-Guillemaud, J. Rothman, V. Favre-Nicolin, S. Tardif, S. Cherifi, J. Cibert, L. Grenet, P. Noé and V. Calvo (Ge,Mn): A ferromagnetic semiconductor for spin injection in silicon

  • J. Phys.: Conf. Ser. 190 (2010), 012129: N A Katcho, M I Richard, O Landré, G Tourbot, M G Proietti, H Renevier, V Favre-Nicolin, B Daudin, G Chen, J J Zhang and G Bauer Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction

  • Phys. Rev. B79 (2009), 195401 V. Favre-Nicolin, J. Eymery, R.K. Koster, P. Gentile Coherent Diffraction Imaging of Single 95nm Nanowires

  • Rayons X & Matière 2007 édité par Philippe Goudeau, René Guinebretière (Eyrolles) - chapitre 4 "Étude de nanostructures de semi-conducteurs par rayonnement synchrotron"

  • J. Phys.: Conf. Ser. 190 (2009) 012129 N A Katcho,M I Richard, O Landré, G Tourbot, M G Proietti, H Renevier, V Favre-Nicolin, B Daudin, G Chen,J J Zhang, G Bauer Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction

  • Appl. Phys. Lett. 94 (2009),131911: J. Eymery, V. Favre-Nicolin, L. Fröberg, and L. Samuelson X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires

  • Eur. Phys. J. 167 (2009),3-10: Richard MI, Katcho NA, Proietti MG, Renevier H, Favre-Nicolin V, Zhong Z, Chen G, Stoffel M, Schmidt O , Renaud G, Schulli TU, Bauer G Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction

  • Appl. Phys. Lett. 94 (2009), 13112: Richard MI, Favre-Nicolin V, Renaud G, Schulli TU, Priester C, Zhong Z, Metzger TH Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays

  • Structural Chemistry 19 (2008), 517-525:Husak M, Jegorov A, Brus J, van Beek W, Pattison P, Christensen M, Favre-Nicolin V, Maixner J Metergoline II: structure solution from powder diffraction data with preferred orientation and from microcrystal

  • Thin Solid Films 517 (2008) 197–200: C. Merckling, G. Saint-Girons, G. Delhaye, G. Patriarche, L. Largeau, V. Favre-Nicollin, M. El-Kazzi, P. Regreny, B. Vilquin, O. Marty, C. Botella, M. Gendry, G. Grenet, Y. Robach, G. Hollinger Epitaxial growth of high-k oxides on silicon

  • J. Appl. Phys. 104, 063521 (2008):B. Amstatt, O. Landré, V. Favre Nicolin, M. G. Proietti, E. Bellet-Amalric, C. Bougerol, H. Renevier, and B. Daudin Anisotropic strain state of the [1-100] GaN quantum dots and quantum wires

  • Characterization of Semiconductor Heterostructures and Nanostructures, Ed. by C Lamberti: T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli Chapter 10: Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering

  • Appl. Phys. Lett. 92 (2008), 241907: G. Saint-Girons, C. Priester, P. Regreny, G. Patriarche, L. Largeau, V. Favre-Nicolin, G. Xu, Y. Robach, M. Gendry, and Guy Hollinger Spontaneous compliance of the InP/SrTiO3 heterointerface

  • Nano Letters 7 (2007), 2596-2601: Eymery J, Rieutord F, Favre-Nicolin V, Robach O, Niquet YM, Froberg L, Martensson T, Samuelson L Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques

  • J. Appl. Phys. 102 (2007), 24101: Merckling C, El-Kazzi M, Saint-Girons G, Hollinger G, Largeau L, Patriarche G, Favre-Nicolin V , Marty O Growth of crystalline gamma-Al<sub>2</sub>O<sub>3</sub> on Si by molecular beam epitaxy: Influence of the substrate orientation

  • J. Cryst. Growth 306 (2007), 47-51: Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G , Hollinger G Strain relaxation and critical thickness for epitaxial LaAlO3 thin films grown on SrTiO3(001) substrates by molecular beam epitaxy

  • Phys. Rev. B 75 (2007),235312: Coraux J, Favre-Nicolin V, Proietti MG, Daudin B, Renevier H Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots

  • Thin Sol. Films 515 (2007), 6479-6483: Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G Epitaxial growth and relaxation of gamma-Al2O3 on silicon

  • Z. Krist. 222 (2007), 105-113: Cerny R, Favre-Nicolin V Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives

  • J. Appl. Phys. 101 (2007), 56106: Coraux J, Favre-Nicolin V, Renevier H, Proietti MG, Amstatt B, Bellet-Amalric E, Daudin B Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction

  • Phys. Rev. B74 (2006),195302: Coraux J, Amstatt B, Budagoski JA, Bellet-Amalric E, Rouviere JL, Favre-Nicolin V, Proietti MG, Renevier H , Daudin B Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study

  • Appl. Phys. Lett. 89 (2006), 153129: Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A Growth mechanism of Si nanowhiskers and SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations

  • Appl. Phys. Lett. 89 (2006), 143114: Schulli TU, Richard MI, Renaud G, Favre-Nicolin V, Wintersberger E, Bauer G In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods

  • Phys. Stat. Sol. B243 (2006), 1519-1523: Coraux J, Renevier H, Proietti MG, Favre-Nicolin V, Daudin B, Renaud G In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots

  • Z Krist. (2006 suppl 23), 411-416: Cerny R, Renaudin G, Tokaychuk Y, Favre-Nicolin V Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction

  • Phys Rev B73 (20006), 205343: Coraux J, Proietti MG, Favre-Nicolin V, Renevier H, Daudin B Step-by-step capping and strain state of GaN/AlN quantum dots studied by grazing-incidence diffraction anomalous fine structure

  • Nucl Inst. & Meth. Phys. B246 (2006), 58-63: Coraux J, Favre-Nicolin V, Proletti MG, Renevier H, Daudin B Grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots

  • Appl. Phys. Lett. 88 (2006), 153125: Coraux J, Renevier H, Favre-Nicolin V, Renaud G, Daudin B In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth

  • Powder Diffr. 20 (2005), 359-365: Cerny R, Favre-Nicolin V FOX: A friendly tool to solve nonmolecular structures from powder diffraction

  • Phys. B: Cond. Matt 357 (2005), 11-15: Letoublon A, Favre-Nicolin V, Renevier H, Proletti MG, Monat C, Gendry M, Marty O, Priester C Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence

  • Z. Krist. 219 (2004), 847-856: Favre-Nicolin- V, Cerny R A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction

  • Acta Cryst B60 (2004), 272-281: Cerny R, Renaudin G, Favre-Nicolin V, Hlukhyy V, Pottgen R Mg<sub>1+x</sub>Ir<sub>1-x</sub> (x=0, 0.037 and 0.054), a binary intermetallic compound with a new orthorhombic structure type determined from powder and single-crystal X-ray diffraction

  • Phys Rev Lett. 92 (2004), 186101: Letoublon A, Favre-Nicolin V, Renevier H, Proietti MG, Monat C, Gendry M, Marty O, Priester C Strain, size, and composition of InAs quantum sticks embedded in InP determined via grazing incidence x-ray anomalous diffraction

  • Mat. Sci For. 443-4 (2004), 35-38: Favre-Nicolin V, Cerny R FOX: Modular approach to crystal structure determination from powder diffraction

  • J. Alloys & Comp. 348 (2003), 129-137: Guenee L, Favre-Nicolin V, Yvon K Synthesis, crystal structure and hydrogenation properties of the ternary compounds LaNi4Mg and NdNi4Mg

  • J. Appl. Cryst. 35(2002), 734-743: Favre-Nicolin V, Cerny R FOX, 'free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction

  • Chem. Comm. 8(2002), 808-809: Edgar M, Carter VJ, Tunstall DP, Grewal P, Favre-Nicolin V, Cox PA, Lightfoot P, Wright PA Structure solution of a novel aluminium methylphosphonate using a new simulated annealing program and powder X-ray diffraction data

  • Acta Cryst. C58(2002), i31-i32: Cerny R, Favre-Nicolin V, Bertheville B A tetragonal polymorph of caesium hydroxide monohydrate, CsOH center dot H2O, from X-ray powder data

  • Phys. Rev. Lett. 87 (2001), 015502: Favre-Nicolin V, Bos S, Lorenzo JE, Hodeau JL, Berar JF, Monceau P, Currat R, Levy F, Berger H Structural evidence for Ta-tetramerization displacements in the charge-density-wave compound (TaSe4)(2)I from x-ray anomalous diffraction

  • Chem. Rev. 101 (2001), 1843-1867: Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF Resonant diffraction

  • J. Appl. Cryst 33(2000), 52-63: Favre-Nicolin V, Bos S, Lorenzo JE, Bordet P, Shepard W, Hodeau JL Integration procedure for the quantitative analysis of dispersive anomalous diffraction

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