Size: 10202
Comment:
|
← Revision 48 as of 2021-02-22 12:37:40 ⇥
Size: 95
Comment:
|
Deletions are marked like this. | Additions are marked like this. |
Line 1: | Line 1: |
* [[http://dx.doi.org/10.1103/PhysRevB.79.195401| Phys. Rev. B79 (2009), 195401]] V. Favre-Nicolin, J. Eymery, R.K. Koster, P. Gentile ''Coherent Diffraction Imaging of Single 95nm Nanowires'' * [[http://dx.doi.org/10.1063/1.3114369|Appl. Phys. Lett. 94 (2009),131911]]: J. Eymery, V. Favre-Nicolin, L. Fröberg, and L. Samuelson ''X-ray measurements of the strain and shape of dielectric/metallic wrap-gated !InAs nanowires'' * [[http://dx.doi.org/10.1140/epjst/e2009-00929-4|Eur. Phys. J. 167 (2009),3-10]]: Richard MI, Katcho NA, Proietti MG, Renevier H, Favre-Nicolin V, Zhong Z, Chen G, Stoffel M, Schmidt O , Renaud G, Schulli TU, Bauer G ''Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction'' * [[http://dx.doi.org/10.1063/1.3064157|Appl. Phys. Lett. 94 (2009), 13112]]: Richard MI, Favre-Nicolin V, Renaud G, Schulli TU, Priester C, Zhong Z, Metzger TH ''Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays'' *[[http://dx.doi.org/10.1007/s11224-008-9312-0|Structural Chemistry 19 (2008), 517-525]]:Husak M, Jegorov A, Brus J, van Beek W, Pattison P, Christensen M, Favre-Nicolin V, Maixner J ''Metergoline II: structure solution from powder diffraction data with preferred orientation and from microcrystal'' * [[http://dx.doi.org/10.1016/j.tsf.2008.08.165|Thin Solid Films 517 (2008) 197–200]]: C. Merckling, G. Saint-Girons, G. Delhaye, G. Patriarche, L. Largeau, V. Favre-Nicollin, M. El-Kazzi, P. Regreny, B. Vilquin, O. Marty, C. Botella, M. Gendry, G. Grenet, Y. Robach, G. Hollinger ''Epitaxial growth of high-k oxides on silicon'' * [[http://link.aip.org/link/?JAPIAU/104/063521/1| J. Appl. Phys. 104, 063521 (2008)]]:B. Amstatt, O. Landré, V. Favre Nicolin, M. G. Proietti, E. Bellet-Amalric, C. Bougerol, H. Renevier, and B. Daudin ''Anisotropic strain state of the [1-100] GaN quantum dots and quantum wires'' * [[http://www.elsevierdirect.com/product.jsp?isbn=9780444530998|Characterization of Semiconductor Heterostructures and Nanostructures, Ed. by C Lamberti]]: T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli ''Chapter 10: Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering'' * [[http://dx.doi.org/10.1063/1.2944140| Appl. Phys. Lett. 92 (2008), 241907]]: G. Saint-Girons, C. Priester, P. Regreny, G. Patriarche, L. Largeau, V. Favre-Nicolin, G. Xu, Y. Robach, M. Gendry, and Guy Hollinger ''Spontaneous compliance of the InP/SrTiO3 heterointerface'' * [[http://dx.doi.org/10.1021/nl070888q|Nano Letters 7 (2007), 2596-2601]]: Eymery J, Rieutord F, Favre-Nicolin V, Robach O, Niquet YM, Froberg L, Martensson T, Samuelson L ''Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques'' * [[http://dx.doi.org/10.1063/1.2753684|J. Appl. Phys. 102 (2007), 24101]]: Merckling C, El-Kazzi M, Saint-Girons G, Hollinger G, Largeau L, Patriarche G, Favre-Nicolin V , Marty O ''Growth of crystalline gamma-Al<sub>2</sub>O<sub>3</sub> on Si by molecular beam epitaxy: Influence of the substrate orientation'' * [[http://dx.doi.org/10.1016/j.jcrysgro.2007.04.048|J. Cryst. Growth 306 (2007), 47-51]]: Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G , Hollinger G ''Strain relaxation and critical thickness for epitaxial !LaAlO3 thin films grown on !SrTiO3(001) substrates by molecular beam epitaxy'' * [[http://dx.doi.org/10.1103/PhysRevB.75.235312|Phys. Rev. B 75 (2007),235312]]: Coraux J, Favre-Nicolin V, Proietti MG, Daudin B, Renevier H ''Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots'' * [[http://dx.doi.org/10.1016/j.tsf.2006.11.157|Thin Sol. Films 515 (2007), 6479-6483]]: Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G ''Epitaxial growth and relaxation of gamma-!Al2O3 on silicon'' * [[http://dx.doi.org/10.1524/zkri.2007.222.3-4.105|Z. Krist. 222 (2007), 105-113]]: Cerny R, Favre-Nicolin V ''Direct space methods of structure determination from powder diffraction: principles, guidelines and perspectives'' * [[http://dx.doi.org/10.1063/1.2422902|J. Appl. Phys. 101 (2007), 56106]]: Coraux J, Favre-Nicolin V, Renevier H, Proietti MG, Amstatt B, Bellet-Amalric E, Daudin B ''Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction'' * [[http://dx.doi.org/10.1103/PhysRevB.74.195302|Phys. Rev. B74 (2006),195302]]: Coraux J, Amstatt B, Budagoski JA, Bellet-Amalric E, Rouviere JL, Favre-Nicolin V, Proietti MG, Renevier H , Daudin B ''Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study'' * [[http://dx.doi.org/10.1063/1.2360225|Appl. Phys. Lett. 89 (2006), 153129]]: Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A ''Growth mechanism of Si nanowhiskers and !SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations'' * [[http://dx.doi.org/10.1063/1.2358300|Appl. Phys. Lett. 89 (2006), 143114]]: Schulli TU, Richard MI, Renaud G, Favre-Nicolin V, Wintersberger E, Bauer G ''In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods'' * [[http://dx.doi.org/10.1002/pssb.200565247|Phys. Stat. Sol. B243 (2006), 1519-1523]]: Coraux J, Renevier H, Proietti MG, Favre-Nicolin V, Daudin B, Renaud G ''In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN quantum dots'' * [[http://dx.doi.org/10.1524/zksu.2006.suppl_23.411|Z Krist. (2006 suppl 23), 411-416]]: Cerny R, Renaudin G, Tokaychuk Y, Favre-Nicolin V ''Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction'' * [[http://dx.doi.org/10.1103/PhysRevB.73.205343|Phys Rev B73 (20006), 205343]]: Coraux J, Proietti MG, Favre-Nicolin V, Renevier H, Daudin B ''Step-by-step capping and strain state of GaN/AlN quantum dots studied by grazing-incidence diffraction anomalous fine structure'' * [[http://dx.doi.org/10.1016/j.nimb.2005.12.045|Nucl Inst. & Meth. Phys. B246 (2006), 58-63]]: Coraux J, Favre-Nicolin V, Proletti MG, Renevier H, Daudin B ''Grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots'' * [[http://dx.doi.org/10.1063/1.2192572|Appl. Phys. Lett. 88 (2006), 153125]]: Coraux J, Renevier H, Favre-Nicolin V, Renaud G, Daudin B ''In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth'' * [[http://dx.doi.org/10.1154/1.2135314|Powder Diffr. 20 (2005), 359-365]]: Cerny R, Favre-Nicolin V ''FOX: A friendly tool to solve nonmolecular structures from powder diffraction'' * [[http://dx.doi.org/10.1016/j.physb.2004.11.009|Phys. B: Cond. Matt 357 (2005), 11-15]]: Letoublon A, Favre-Nicolin V, Renevier H, Proletti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size and composition of !InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence'' * [[http://dx.doi.org/10.1524/zkri.219.12.847.55869|Z. Krist. 219 (2004), 847-856]]: Favre-Nicolin- V, Cerny R ''A better FOX: using flexible modelling and maximum likelihood to improve direct-space ab initio structure determination from powder diffraction'' * [[http://scripts.iucr.org/cgi-bin/paper?av5006|Acta Cryst B60 (2004), 272-281]]: Cerny R, Renaudin G, Favre-Nicolin V, Hlukhyy V, Pottgen R ''Mg<sub>1+x</sub>Ir<sub>1-x</sub> (x=0, 0.037 and 0.054), a binary intermetallic compound with a new orthorhombic structure type determined from powder and single-crystal X-ray diffraction'' * [[http://dx.doi.org/10.1103/PhysRevLett.92.186101|Phys Rev Lett. 92 (2004), 186101]]: Letoublon A, Favre-Nicolin V, Renevier H, Proietti MG, Monat C, Gendry M, Marty O, Priester C ''Strain, size, and composition of !InAs quantum sticks embedded in InP determined via grazing incidence x-ray anomalous diffraction'' * '''Mat. Sci For. 443-4 (2004), 35-38''': Favre-Nicolin V, Cerny R ''FOX: Modular approach to crystal structure determination from powder diffraction'' * [[http://dx.doi.org/10.1016/S0925-8388(02)00797-1|J. Alloys & Comp. 348 (2003), 129-137]]: Guenee L, Favre-Nicolin V, Yvon K ''Synthesis, crystal structure and hydrogenation properties of the ternary compounds !LaNi4Mg and !NdNi4Mg'' * [[http://scripts.iucr.org/cgi-bin/paper?vi0168|J. Appl. Cryst. 35(2002), 734-743]]: Favre-Nicolin V, Cerny R ''FOX, 'free objects for crystallography': a modular approach to ab initio structure determination from powder diffraction'' * [[http://www.rsc.org/publishing/journals/CC/article.asp?doi=b200318j|Chem. Comm. 8(2002), 808-809]]: Edgar M, Carter VJ, Tunstall DP, Grewal P, Favre-Nicolin V, Cox PA, Lightfoot P, Wright PA ''Structure solution of a novel aluminium methylphosphonate using a new simulated annealing program and powder X-ray diffraction data'' * [[http://scripts.iucr.org/cgi-bin/paper?S0108270101021928|Acta Cryst. C58(2002), i31-i32]]: Cerny R, Favre-Nicolin V, Bertheville B ''A tetragonal polymorph of caesium hydroxide monohydrate, CsOH center dot H2O, from X-ray powder data'' * [[http://dx.doi.org/10.1103/PhysRevLett.87.015502|Phys. Rev. Lett. 87 (2001), 015502]]: Favre-Nicolin V, Bos S, Lorenzo JE, Hodeau JL, Berar JF, Monceau P, Currat R, Levy F, Berger H ''Structural evidence for Ta-tetramerization displacements in the charge-density-wave compound (!TaSe4)(2)I from x-ray anomalous diffraction'' * [[http://dx.doi.org/10.1021/cr0000269|Chem. Rev. 101 (2001), 1843-1867]]: Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF ''Resonant diffraction'' * [[http://dx.doi.org/10.1107/S0021889899012364|J. Appl. Cryst 33(2000), 52-63]]: Favre-Nicolin V, Bos S, Lorenzo JE, Bordet P, Shepard W, Hodeau JL ''Integration procedure for the quantitative analysis of dispersive anomalous diffraction'' |
[[http://scholar.google.fr/citations?user=PFyCb70AAAAJ|Vincent Favre-Nicolin@Google Scholar]] |